@Article{BerniRibePaesBelo:2015:SyMeSp,
               author = "Berni, Luiz Angelo and Ribeiro, M. S. and Paes, Tiago 
                         Fran{\c{c}}a and Beloto, Antonio Fernando",
          affiliation = "{Instituto Nacional de Pesquisas Espaciais (INPE)} and {} and 
                         {Instituto Nacional de Pesquisas Espaciais (INPE)} and {Instituto 
                         Nacional de Pesquisas Espaciais (INPE)}",
                title = "System for measuring the spatial reflectance distribution of 
                         material surfaces",
              journal = "Journal of Physics: Conference Series",
                 year = "2015",
               volume = "605",
                pages = "012003",
                 note = "{Setores de Atividade: Pesquisa e desenvolvimento 
                         cient{\'{\i}}fico.}",
             keywords = "Reflectance, Porous Sillicon, Materials suface.",
                  doi = "10.1088/1742-6596/605/1/012003",
                  url = "http://dx.doi.org/10.1088/1742-6596/605/1/012003",
                 issn = "1742-6588",
                label = "lattes: 3894119234731870 4 BerniRibePaesBelo:2015:SyMeSp",
             language = "pt",
           targetfile = "paper_ICO_Berni.pdf",
        urlaccessdate = "27 abr. 2024"
}